Webinar - PID: Mechanisms, Recognition and Mitigation

16 Feb. 2017 by

Potential Induced Degradation may cause power loss of up to 30%. Join our panel of experts to learn more about PID and the methods for identification, mitigation and prevention.

DNV GL's Jenya Meydbray will present module degradation results from multiple stress tests, and Omron's Adrián Ramos will present an actual case of PID with acquired field data.